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26th IEEE VLSI TEST SYMPOSIUM (VTS 2008)
April 27th - May 1st, 2008
Rancho Bernardo Inn, San Diego, California, USA

http://www.tttc-vts.org

ONLINE REGISTRATION IS NOW AVAILABLE
Advance Registration Rates End April 4, 2008

LAST CHANCE TO TAKE ADVANTAGE OF DISCOUNTED VTS 2008 ROOM RATES
Room Rates At the Rancho Bernardo Inn Will Increase After APRIL 4, 2008

VTS 2008 NEWSLETTER

Chairs' Message

Alex Orailoglu
General Chair

Peter Maxwell, and Cecilia Metra
Program Co-Chairs

Welcome to VTS 2008, the twenty-sixth in a series of annual symposia that focus on innovation in the field of testing of integrated circuits and systems.

The core of VTS 2008, the three day technical program, responds to the many trends and challenges in the semiconductor design and manufacturing industries with papers covering a diverse set of topics including, RF, Analog and Mixed Signal Circuit Test, ATPG, Delay Test, High Speed Test, Memory Test, Compaction, Debug and Diagnosis, and Reliability and Fault Tolerance.

In addition to the three-day technical program, VTS 2008 features Special Sessions, and the Innovative Practices Tracks. These tracks highlight cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them.

Three full-day tutorials and two workshops are also held in conjunction with VTS 2008. Particularly, the International Workshop on Silicon Debug and Diagnosis (SDD) and the Workshop on Test of Wireless Circuits and Systems (WTW) will take place this year. Three tutorials are offered by the TTTC Tutorials & Education Group through the Test Technology Education Program (TTEP). The tutorials by leading VLSI test academics and practitioners provide introduction to a diverse set of topics, including reliability and hardening techniques, statistical screening, and analog, mixed-signal and RF circuit testing. The tutorials provide opportunities for design and test professionals to update their knowledge base in test, and earn official IEEE TTTC accreditation.

The social program at VTS provides an opportunity for informal technical discussions among participants. San Diego, California, provides a very attractive backdrop for all VTS 2008 activities. For the first time, VTS will have an international social program to sample the charms of Baja California, Mexico.

We are sure that you will find VTS 2008 enlightening, thought-provoking, rewarding, and enjoyable, and will keep making VTS a success through your active participation.

HIGHLIGHTS OF VTS 2008

The advance registration deadline for VTS2008 is rapidly approaching on April 4. Don't miss out on the opportunity to obtain discount registration for this exciting conference.

This year, in addition to traditional test topics, VTS explores new areas and hot topics such as quantum computing, yield management, nanoelectronics, and biomedical devices.

14:40-15:40, Monday, April 28, 2008
Session 3B – Special Session
New Topic: Why Nanoscale Physics Favors Quantum Information & Why Computing is Possible in Spite of Quantum Uncertainty

13:45-15:15, Tuesday, April 29, 2008
Session 9A – Hot Topic Session
Yield Management and DPPM Reduction

13:45-15:15, Tuesday, April 29, 2008
Session 9B – Special Session
Embedded Tutorial: Nanoelectronics – What next? From Moore’s Law to Feynman’s vision

14:00-15:30, Wednesday, April 30, 2008
Session 13B – Hot Topic Session
Biomedical Devices – New Test Challenges

Plenary Session:
9:00-10:30, Monday, April 28, 2008

Keynote Address by Michael Campbell, Senior Vice President of Engineering, Qualcomm CDMA Technologies.

Invited Keynote, ”A Revolution in Design and Test Technology,” by Prof. Melvin Breuer, University of Southern California.

 

Special Sessions and Innovative Practices:
They highlight cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them.  This year, before attending the exciting talks, you can preview the abstracts of all the presentations at the HTML version of VTS2008 technical program.

Full Day Tutorials:
08:30-16:30, Sunday, April 27, 2008 
TUTORIAL 1: Soft Errors: Technology Trends, System Effects, Protection Techniques and Case Studies
PRESENTERS: Subhasish Mitra (Stanford University), Pia Sanda (IBM), Norbert Seifert (Intel

08:30-16:30, Thursday, May 1, 2008
TUTORIAL 2: Practices in Analog, Mixed-signal and RF Testing

PRESENTERS: Salem Abdennadher (Intel), Saghir Shaikh (Cadence)

08:30-16:30, Thursday, May 1, 2008
TUTORIAL 3: Statistical Screening Methods Targeting “Zero Defect” IC Quality and Reliability
PRESENTERS:
Adit Singh (Auburn University)

 

 

 

 

 

 

Bring your Passport!

Social Program:
15:30-23:00, Tuesday, April 29, 2008

For this year's social event we will journey south of the US border to visit Baja California, Mexico. The Tourist Corridor just south of the California border includes Tijuana, Ensenada and Rosarito. The region has long endeared itself to visiting Americans and International travelers in search of sprawling coastlines with a Southern California climate.

Our first stop will be Tecate, Mexico. Tecate offers a charming small-town ambience even today, an attraction that keeps bringing tourists into the town. There's a thriving artists' colony that influences the temper of the town. Rather than the usual curios found in border towns, local pottery, tile and glassworks are displayed at shops and handicraft centers, and local art is displayed at galleries around town. We will have time to sample local sweet breads and beer for which the town is famous, and visit Hidalgo Plaza, where visitors can enjoy Tecate's unique beauty.

Next, we visit Rosarito, Mexico. Rosarito lies along the sea coast, and has a mild climate with plenty of sun and a soft sea breeze. Each year, thousands of tourists run from the hustle and bustle of large cities to relax on the beaches of Rosarito.

We will dine at a beautiful beach-side resort in nearby Puerto Nuevo. We will be met with a welcome drink and enjoy the sunset and a nice dinner with traditional Mexican food and folkloric dance and mariachi.

Please do not forget to bring your passport to participate in this exciting excursion. Foreign visitors should ensure that they have double or multiple entry visas to the US if necessary.

The web site for US passport requirements can be found at U.S. Department of States International Travel Information to Mexico and Western Hemisphere Travel Initiative

The web link to VISA requirements to Mexico for citizens of US and other countries can be found at Mexican Foreign Ministry VISA for Foreigners

Busses will leave the Hotel at 3:30 p.m. and depart Baja at 11 p.m. There is no extra cost for this program for VTS attendees who register at member and non-member rates. Students and companions of VTS attendees can register for the Social Program for $100 per person. To guarantee your participation in this program you must register before April 4, 2008.

VTS 2008 Online Registration

VTS 2008 Hotel Reservations:
Rancho Bernardo Inn

The 26th IEEE VLSI TEST SYMPOSIUM (VTS 2008) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

SENIOR PAST CHAIR
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TTTC 2ND VICE CHAIR
Chen-Huan CHIANG

Alcatel-Lucent - USA
Tel. +1-973-386-6759
E-mail chenhuan@alcatle-lucent.com

FINANCE
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

DESIGN & TEST MAGAZINE
Tim CHENG
University of California, Santa Barbara - USA
Tel. +1-805-893-72942
E-mail timcheng@ece.ucsb.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG
Alcatel-Lucent - USA
Tel. +1-973-386-6759
E-mail chenhuan@alcatle-lucent.com

TECHNICAL ACTIVITIES
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

ASIA & SOUTH PACIFIC
Hideo FUJIWARA
Nara Institute of Science and Technology - Japan
Tel. +81-74-372-5220
E-mail fujiwara@is.aist-nara.ac.jp

LATIN AMERICA
Marcelo LUBASZEWSKI
Federal University of Rio Grande do Sul - Brazil
Tel. +34-93-401-6603
E-mail luba@vortex.ufrgs.br

NORTH AMERICA
William R. MANN
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

 

PAST CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

TTTC 1ST VICE CHAIR
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

SECRETARY
Christian LANDRAULT
LIRMM - France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

INTERNATIONAL TEST CONFERENCE
Jill E. SIBERT
Raspberry Comm.
- USA
Tel. +1-484-894-1111
E-mail jill_sibert@raspberrycom.com

TEST WEEK COORDINATION
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Piraeus
- Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR

Synopsys
- USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Zebo PENG
Linköping University - Sweden
Tel. +46-13-282-067/-281-000
E-mail zpe@ida.liu.se

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino - Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it